An article by Ronald Reliford of Campti has been published in Cambridge Core, the home of academic content for Cambridge University Press. “Analysis of Denton E-Beam 2 Nanofabricated Thin Films by Metrology” highlights the importance of instrumentation (measurement and control) and metrology (study of measurement) in nanotechnology and its emerging applications in everything from electronics to medicine. Reliford experimented with three different techniques for layering chromium on silicone.
“The usage of multiple methods of metrology is to investigate the consistency and uniformity of the fabricated films,” he wrote. “In addition, results of the study will help identify standard and reliable methods to measure surfaces at the nanoscale.”
Dr. Jafar Al-Sharab, head of NSU’s Department of Engineering Technology, is coauthor of the paper.
Reliford is a senior in the Department of Engineering Technology, currently an intern at Frymaster in Shreveport.
Earlier this year, Reliford penned an article that appeared in a news outlet managed by Georgia Tech University’s Institute for Electronics and Nanotechnology, where he was an intern. He was then asked to participate in a full semester internship at the National Institute of Standards and Technology (NIST), which is a part of the U.S. Department of Commerce. NIST promotes U.S. industrial competitiveness, advances measurement science and develops measurement standards.
Reliford’s research at NIST has been submitted for publication in The Journal of Microscopy and Microanalysis. He is the first of NSU’s Engineering Technology students to take an internship at a premier scientific institution like NIST.
Information on NSU’s Department of Engineering Technology is available at https://engrtech.nsula.edu.